LayTec

LayTec is the leader in the field of in-situ monitoring systems for MOCVD, MBE and other thin-film processes. Its sensors measure growth properties like growth rate, layer thickness, doping levels, ternary material composition, surface roughness, wafer surface temperature and wafer bowing with an extreme precision already during the deposition process, which is indispensable for optimizing material quality and obtaining run-to-run reproducibility in epitaxy-based opto-electronic and electronic applications.