Nearfield Instruments (NFI)

Nearfield Instruments (NFI) brings together the most creative minds in science and technology to develop a revolutionary high throughput atomic force microscopy system enabling atom-scale resolution 3D metrology at industry-level throughput, based on three pillars: Unrivalled measurement speed; Parallelization capability; Advanced measurement modes. NFI designs, develops, integrates, markets and services these advanced metrology machines. These machine enable its customers – the world’s leading chipmakers – to increase their production yields, and thus, functionality of their microchips, which in turn leads to smaller, more powerful consumer electronics. NFI aims to develop leading edge metrology systems, to be installed at the customer site, within specifications, on time, with quality exceeding the customer’s expectations.